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Graphite Carbon-Doped Sb2Te Nanostructures for Phase-Change Memory Applications

  • Peng Xu
  • , Yun Meng
  • , Zhen Li
  • , Xiaolin Liu
  • , Jian Zhou
  • , Sannian Song
  • , Zhitang Song
  • , Zhimei Sun
  • , Liangcai Wu*
  • *Corresponding author for this work
  • Donghua University
  • Shandong Normal University
  • University of Warwick
  • CAS - Shanghai Institute of Microsystem and Information Technology

Research output: Contribution to journalArticlepeer-review

Abstract

High thermal stability, fast operation speed, low thickness variation, and low resistance drift of phase-change nanomaterials are the essential characteristics in phase-change memory (PCM) applications. In this work, we put forward a graphite carbon-doped Sb2Te (C-Sb2Te) chalcogenide with semiconductor process compatibility. Our results prove that the proposed C-Sb2Te has excellent thermal stability and high operation speed. More importantly, the thickness change and resistance drift are only 0.89% and 0.0149, respectively. The C-Sb2Te-based memory device exhibits a high switching speed to the instrument test limit (5 ns) with a large resistance ratio, low operation voltage (2 V), and low power consumption (6.9 pJ). The proposed C-Sb2Te nanostructure material exceeds both conventional Ge2Sb2Te5and transition-metal-doped Sb2Te materials in terms of its performance. Ab initio molecular dynamics simulations reveal that C-C and C-Sb bonds as well as C-C chains are formed in C-Sb2Te, and C doping constrains phase transition in a small region and refines grains of C-Sb2Te, thus resulting in the high performance. Our study suggests that C-Sb2Te is a potential candidate for high-speed, high-thermal-stability, and high-reliability PCM applications.

Original languageEnglish
Pages (from-to)8668-8674
Number of pages7
JournalACS Applied Nano Materials
Volume6
Issue number10
DOIs
StatePublished - 26 May 2023

Keywords

  • fast switching speed
  • graphite carbon doping
  • low power consumption
  • low resistance drift
  • low thickness change
  • phase-change memory

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