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General-utility testing path model of switches for ATE and application

  • Ruixian Zhao*
  • , Xiaofeng Meng
  • , Guohua Wang
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journalArticlepeer-review

Abstract

In order to solve the questions such as searching testing path, judging testing path conflict and managing testing path of switches during the course of programming testing programs (TP) of automation testing equipment (ATE), a general-utility testing path model of switches was brought forward, the model general description and interlink algorithm for much more switches connecting were presented, and the material application methods of the model was introduced. The automated searching of optimum testing path and judging of testing path conflict are realized, the fault of testing path can be isolated well and TP are not related to the material path hardware by the model means. Accordingly the general-utility and replantability of TP are improved, and the workload of programming TP is reduced.

Original languageEnglish
Pages (from-to)181-185
Number of pages5
JournalBeijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
Volume32
Issue number2
StatePublished - Feb 2006

Keywords

  • Automation testing equipment
  • Optimization
  • Path conflict
  • Switches
  • Testing path

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