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Force acquisition system for digital impact tester

  • Fu Yongling*
  • , Han Guohui
  • , Li Gangjun
  • *Corresponding author for this work
  • Beihang University
  • Chengdu Technological University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A force acquisition system for digital impact tester was investigated, in which structural design of bar-shaped elastic element, circuit design as well as static analysis were involved. Based on analysis of international requirements on the detection precision of digital impact tester, information concerning the precision of sensor parameters, sensors and adhesive was collected, and adhesion sites were settled through finite element analysis and optimization. Circuit design involved zero setting, temperature compensation, amplifying circuit, filter circuit and circuits to connect host computer. Loading calibration test was performed on sensors under static working condition. According to partial authoritative examination, the linearity was 0.06%, the repetitiveness was 0.01%, the retardation was 0.08%, and the sensitivity was 1.112mV /V . According to the examination conducted in some metrology institute, the total work error of impact in a digital impact tester adopting the above force acquisition system was 2% of the impact value of a standard specimen, which has already reached the precision level and met the design requirement.

Original languageEnglish
Title of host publicationICEMI 2009 - Proceedings of 9th International Conference on Electronic Measurement and Instruments
Pages1322-1326
Number of pages5
DOIs
StatePublished - 2009
Event9th International Conference on Electronic Measurement and Instruments, ICEMI 2009 - Beijing, China
Duration: 16 Aug 200919 Aug 2009

Publication series

NameICEMI 2009 - Proceedings of 9th International Conference on Electronic Measurement and Instruments

Conference

Conference9th International Conference on Electronic Measurement and Instruments, ICEMI 2009
Country/TerritoryChina
CityBeijing
Period16/08/0919/08/09

Keywords

  • Amplifying circuit
  • Digital impact tester
  • Force acquisition system
  • Force sensor

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