Feature extraction using random walks

  • Yue Deng*
  • , Qionghai Dai
  • , Zengke Zhang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, a novel idea, which utilizes the metric on a graph, is proposed to extract prominent features for pattern recognition. This proposed model, called "Graphical Metrics Guided Transformation" (GMGT), aims to find projections that can preserve the original metric on the graphic domain in a new Euclidean subspace. With the functional analysis, we present the definition of the metric in the graphical domain and prove that the commute time of random walk is a metric on graphs with the help of real physical model. Furthermore, a new feature extraction algorithm based on GMGT and the commute time is proposed, and is applied to face recognition.

Original languageEnglish
Title of host publicationProceedings - 2009 IEEE Youth Conference on Information, Computing and Telecommunication, YC-ICT2009
Pages498-501
Number of pages4
DOIs
StatePublished - 2009
Externally publishedYes
Event2009 IEEE Youth Conference on Information, Computing and Telecommunication, YC-ICT2009 - Beijing, China
Duration: 20 Sep 200921 Sep 2009

Publication series

NameProceedings - 2009 IEEE Youth Conference on Information, Computing and Telecommunication, YC-ICT2009

Conference

Conference2009 IEEE Youth Conference on Information, Computing and Telecommunication, YC-ICT2009
Country/TerritoryChina
CityBeijing
Period20/09/0921/09/09

Keywords

  • Commute time
  • Random walk
  • Spectral graphic
  • Subspace learning

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