TY - GEN
T1 - Fault diagnosis methods for advanced diagnostics and prognostics testbed (ADAPT)
T2 - 12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015
AU - Ren, Feiyi
AU - Yu, Jinsong
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/6/16
Y1 - 2016/6/16
N2 - Nowadays in industrial processes, whether producers or users think highly of performance reliability and robustness of equipments. Therefore, the FDI (Fault detection and isolation) and maintenance techniques have become hot topics for health management of industrial units, as a safety guarantee indeed. As a consequence, researchers have made great efforts to develop, verify and refine diverse diagnosis techniques, meanwhile compare and screening them in order to apply them properly in practice. And then, NASA Ames has built the Advanced Diagnostics and Prognostics Testbed, a real-world system as a general platform for verification and validation (V&V) of diagnosis techniques. Until now, many researchers have developed effective diagnosis algorithms specially applied to this system. In this paper, we introduce the ADAPT and the diagnosis competition around the system, and we review a variety of diagnosis methods divided mainly in three types, model-based, optimization-based and artificial intelligence-based methods, while elaborating the first type in detail by two sorts of model: physical and graphic, of which the second attracts more and more attention of scientists in actual research. Finally, we make a comparison among them based on simplified metrics of qualification, which plays an important role in choosing appropriate methods for diagnosing a special problem.
AB - Nowadays in industrial processes, whether producers or users think highly of performance reliability and robustness of equipments. Therefore, the FDI (Fault detection and isolation) and maintenance techniques have become hot topics for health management of industrial units, as a safety guarantee indeed. As a consequence, researchers have made great efforts to develop, verify and refine diverse diagnosis techniques, meanwhile compare and screening them in order to apply them properly in practice. And then, NASA Ames has built the Advanced Diagnostics and Prognostics Testbed, a real-world system as a general platform for verification and validation (V&V) of diagnosis techniques. Until now, many researchers have developed effective diagnosis algorithms specially applied to this system. In this paper, we introduce the ADAPT and the diagnosis competition around the system, and we review a variety of diagnosis methods divided mainly in three types, model-based, optimization-based and artificial intelligence-based methods, while elaborating the first type in detail by two sorts of model: physical and graphic, of which the second attracts more and more attention of scientists in actual research. Finally, we make a comparison among them based on simplified metrics of qualification, which plays an important role in choosing appropriate methods for diagnosing a special problem.
KW - ADAPT
KW - Diagnosis method
KW - Model-based
KW - Optimization-based
UR - https://www.scopus.com/pages/publications/84978818207
U2 - 10.1109/ICEMI.2015.7494248
DO - 10.1109/ICEMI.2015.7494248
M3 - 会议稿件
AN - SCOPUS:84978818207
T3 - 2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
SP - 175
EP - 180
BT - 2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
A2 - Jianping, Cui
A2 - Juan, Wu
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 16 July 2015 through 18 July 2015
ER -