Fault diagnosis methods for advanced diagnostics and prognostics testbed (ADAPT): A review

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Nowadays in industrial processes, whether producers or users think highly of performance reliability and robustness of equipments. Therefore, the FDI (Fault detection and isolation) and maintenance techniques have become hot topics for health management of industrial units, as a safety guarantee indeed. As a consequence, researchers have made great efforts to develop, verify and refine diverse diagnosis techniques, meanwhile compare and screening them in order to apply them properly in practice. And then, NASA Ames has built the Advanced Diagnostics and Prognostics Testbed, a real-world system as a general platform for verification and validation (V&V) of diagnosis techniques. Until now, many researchers have developed effective diagnosis algorithms specially applied to this system. In this paper, we introduce the ADAPT and the diagnosis competition around the system, and we review a variety of diagnosis methods divided mainly in three types, model-based, optimization-based and artificial intelligence-based methods, while elaborating the first type in detail by two sorts of model: physical and graphic, of which the second attracts more and more attention of scientists in actual research. Finally, we make a comparison among them based on simplified metrics of qualification, which plays an important role in choosing appropriate methods for diagnosing a special problem.

Original languageEnglish
Title of host publication2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
EditorsCui Jianping, Wu Juan
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages175-180
Number of pages6
ISBN (Electronic)9781479976195
DOIs
StatePublished - 16 Jun 2016
Event12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015 - Qingdao, China
Duration: 16 Jul 201518 Jul 2015

Publication series

Name2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
Volume1

Conference

Conference12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015
Country/TerritoryChina
CityQingdao
Period16/07/1518/07/15

Keywords

  • ADAPT
  • Diagnosis method
  • Model-based
  • Optimization-based

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