Abstract
In the fatigue life test of high-reliability airplane structures, a large number of zero-failure data can be obtained, in which case the fatigue life scatter factor is significantly different from that of complete data. This paper conducted a study to define a scatter factor correction coefficient for normal distribution and two-parameter Weibull distribution under the condition of zero-failure data and derived the difference of the scatter factor under these two cases theoretically. At the same time, in order to analyze the difference, a comparative analysis of numerical simulation results under a certain reliability index is presented. The results show that this method makes full use of the product information under the conditions of zero-failure data to enhance the structures' fatigue safe life and to meet the practical engineering requirements.
| Original language | English |
|---|---|
| Article number | 022010 |
| Journal | Journal of Physics: Conference Series |
| Volume | 1213 |
| Issue number | 2 |
| DOIs | |
| State | Published - 19 Jun 2019 |
| Event | 2019 2nd International Conference on Advanced Algorithms and Control Engineering, ICAACE 2019 - Guilin, China Duration: 26 Apr 2019 → 28 Apr 2019 |
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