TY - GEN
T1 - Fatigue life prediction model for PCB under random vibration
AU - Liu, Zhaoxia
AU - Sun, Yufeng
AU - Sun, Xiaotong
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/2
Y1 - 2017/7/2
N2 - Electronic products may be subjected to vibration inevitably in the process of transport, storage, and use causing electronic equipment failure. It is necessary to estimate fatigue life of electronic equipment from the board level under random vibration. At present, the common method of estimating fatigue life for general structure is to combine S-N curve with linear fatigue damage accumulation theory. Based on this theory, a new fatigue life prediction model for PCB (Printed Circuit Board) under random Vibration was proposed. The PCB was simplified as a single-degree-of-freedom system. Transmission rate was introduced. A relationship between frequency and damping ratio established. The fatigue life formula of the PCB under random vibration was derived. Then the influence factors of fatigue life were further analyzed using the method of finite element analysis from the aspects of material structure. Finally, taking an electronic device as an example, the life of the PCB was predicted and compared with the experimental results. The results show that the model proposed in this paper is more practical and accurate.
AB - Electronic products may be subjected to vibration inevitably in the process of transport, storage, and use causing electronic equipment failure. It is necessary to estimate fatigue life of electronic equipment from the board level under random vibration. At present, the common method of estimating fatigue life for general structure is to combine S-N curve with linear fatigue damage accumulation theory. Based on this theory, a new fatigue life prediction model for PCB (Printed Circuit Board) under random Vibration was proposed. The PCB was simplified as a single-degree-of-freedom system. Transmission rate was introduced. A relationship between frequency and damping ratio established. The fatigue life formula of the PCB under random vibration was derived. Then the influence factors of fatigue life were further analyzed using the method of finite element analysis from the aspects of material structure. Finally, taking an electronic device as an example, the life of the PCB was predicted and compared with the experimental results. The results show that the model proposed in this paper is more practical and accurate.
KW - fatigue life
KW - finite element analysis
KW - random vibration
UR - https://www.scopus.com/pages/publications/85046638332
U2 - 10.1109/ICSRS.2017.8272827
DO - 10.1109/ICSRS.2017.8272827
M3 - 会议稿件
AN - SCOPUS:85046638332
T3 - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
SP - 232
EP - 237
BT - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on System Reliability and Safety, ICSRS 2017
Y2 - 20 December 2017 through 22 December 2017
ER -