Skip to main navigation Skip to search Skip to main content

Fast vectorless power grid verification using maximum voltage drop location estimation

  • Tsinghua University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Power grid integrity verification is critical for reliable chip design. Vectorless power grid verification provides a promising approach to evaluate the worst-case voltage fluctuations without the detailed information of circuit activities. Vectorless verification is usually required to solve numerous linear programming problems to obtain the worst-case voltage fluctuation throughout the grid, which is extremely time-consuming for large-scale verification. In this paper, a maximum voltage drop location estimation approach is proposed for efficient vectorless verification. The power grid nodes are grouped into disjoint subsets, and an estimation strategy is utilized to roughly locate the nodes which have the worst-case voltage drop in each group. Consequently, the verification problem size can be significantly reduced compared with accurate verification. Experimental results show that the proposed approach can achieve remarkable speedups with acceptable accuracy loss.

Original languageEnglish
Title of host publication2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Proceedings
Pages861-866
Number of pages6
DOIs
StatePublished - 2014
Externally publishedYes
Event2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014 - Suntec, Singapore
Duration: 20 Jan 201423 Jan 2014

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference2014 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014
Country/TerritorySingapore
CitySuntec
Period20/01/1423/01/14

Fingerprint

Dive into the research topics of 'Fast vectorless power grid verification using maximum voltage drop location estimation'. Together they form a unique fingerprint.

Cite this