TY - GEN
T1 - Failure mechanism behavior and reliability of non-repairable system with functional dependence
AU - Yu, Xiaoyong
AU - Chen, Ying
AU - Kang, Rui
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/2
Y1 - 2017/7/2
N2 - In the case of system with function dependent behavior, the failure of one component will cause dependent components within the system to become unusable or workable, and the state of failure mechanisms of dependent components will be changed. Reliability study of functional dependence has never refer to failure mechanism level. This paper use a reliability evaluation method considering failure mechanism behavior in components with functional dependence, which includes the second type of trigger and suspension. FMT and FDEP gate are used to express the failure mechanism behavior. A case study is utilized to illustrate the failure mechanism behavior in system, a BDD model of system and some reliability curves are obtained at the end of this paper.
AB - In the case of system with function dependent behavior, the failure of one component will cause dependent components within the system to become unusable or workable, and the state of failure mechanisms of dependent components will be changed. Reliability study of functional dependence has never refer to failure mechanism level. This paper use a reliability evaluation method considering failure mechanism behavior in components with functional dependence, which includes the second type of trigger and suspension. FMT and FDEP gate are used to express the failure mechanism behavior. A case study is utilized to illustrate the failure mechanism behavior in system, a BDD model of system and some reliability curves are obtained at the end of this paper.
KW - failure mechanism
KW - functional dependence
KW - suspension
KW - the second type of trigger
UR - https://www.scopus.com/pages/publications/85046684742
U2 - 10.1109/ICSRS.2017.8272816
DO - 10.1109/ICSRS.2017.8272816
M3 - 会议稿件
AN - SCOPUS:85046684742
T3 - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
SP - 175
EP - 179
BT - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on System Reliability and Safety, ICSRS 2017
Y2 - 20 December 2017 through 22 December 2017
ER -