Abstract
This paper proposed a failure-behavior-model based accelerated degradation test designing method for assessing the storage life of accelerometer for inertial navigation products, which determines test stress levels while lacking of the preliminary experimental data. On the basis of analyzing the product characteristics and main mechanisms, the storage life characteristic parameters and test stress types are determined. An accelerometer failure behavior model which takes the material dispersion into consideration is established to describe the time-varying law. Given the highest stress level, based on the given confidence level and failure behavior model, a simulation accelerated degradation test design method is proposed to determine the lowest and intermediate stress levels with the constraint that the upper bound of degradation under lower stress level is lower than the lower bound of degradation under high stress level. Following the proposed framework, the experimental profile is designed, and then a best test plan is finally obtained. The validity of the proposed method is verified by a case study.
| Original language | English |
|---|---|
| Pages (from-to) | 437-443 |
| Number of pages | 7 |
| Journal | Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics |
| Volume | 44 |
| Issue number | 3 |
| DOIs | |
| State | Published - Mar 2018 |
Keywords
- Accelerometer
- Failure behavior model
- Inertial navigation products
- Plan optimization
- Test design
Fingerprint
Dive into the research topics of 'Failure behavior based storage life test design for inertial navigation products'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver