TY - GEN
T1 - Exploiting deep convolutional network and patch-level CRFs for indoor semantic segmentation
AU - Wu, Xingming
AU - Du, Mengnan
AU - Chen, Weihai
AU - Li, Zhengguo
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/10/19
Y1 - 2016/10/19
N2 - Recent advances in semantic segmentation have mostly been achieved by utilizing deep convolutional neural networks (CNNs). In this paper, a novel indoor semantic segmentation method is proposed by integrating CNN and patch-level Conditional random fields (CRF). Multi-scale images are sent to CNN to capture objects of different sizes as well as to extract features at multiple scales. Patch-level CRF is constructed to further refine the object boundaries localization accuracy. Extensive experiments on the publicly available NYU V2 database demonstrate that the proposed method could obtain state-of-the-art accuracy in terms of four evaluation metrics.
AB - Recent advances in semantic segmentation have mostly been achieved by utilizing deep convolutional neural networks (CNNs). In this paper, a novel indoor semantic segmentation method is proposed by integrating CNN and patch-level Conditional random fields (CRF). Multi-scale images are sent to CNN to capture objects of different sizes as well as to extract features at multiple scales. Patch-level CRF is constructed to further refine the object boundaries localization accuracy. Extensive experiments on the publicly available NYU V2 database demonstrate that the proposed method could obtain state-of-the-art accuracy in terms of four evaluation metrics.
UR - https://www.scopus.com/pages/publications/84997217115
U2 - 10.1109/ICIEA.2016.7603568
DO - 10.1109/ICIEA.2016.7603568
M3 - 会议稿件
AN - SCOPUS:84997217115
T3 - Proceedings of the 2016 IEEE 11th Conference on Industrial Electronics and Applications, ICIEA 2016
SP - 150
EP - 155
BT - Proceedings of the 2016 IEEE 11th Conference on Industrial Electronics and Applications, ICIEA 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th IEEE Conference on Industrial Electronics and Applications, ICIEA 2016
Y2 - 5 June 2016 through 7 June 2016
ER -