Experimental investigation of loss and gain characteristics of an abnormal InxGa1-xAs/GaAs quantum well structure

  • Yan Jia
  • , Qingnan Yu
  • , Fang Li
  • , Mingqing Wang
  • , Wei Lu
  • , Jian Zhang
  • , Xing Zhang
  • , Yongqiang Ning
  • , Jian Wu*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this Letter, the loss and gain characteristics of an unconventional InxGa1-xAs/GaAs asymmetrical step well structure consisting of variable indium contents of InxGa1-xAs materials are measured and analyzed for the first time, to the best of our knowledge. This special well structure is formed based on the indium-rich effect from the material growth process. The loss and gain are obtained by optical pumping and photoluminescence (PL) spectrum measurement at dual facets of an edge-emitting device. Unlike conventional quasi-rectangle wells, the asymmetrical step well may lead to a hybrid strain configuration containing both compressive and tensile strains and, thus, special loss and gain characteristics. The results will be very helpful in the development of multiple wavelength InGaAs-based semiconductor lasers.

Original languageEnglish
Article number011402
JournalChinese Optics Letters
Volume16
Issue number1
DOIs
StatePublished - 10 Jan 2018

Fingerprint

Dive into the research topics of 'Experimental investigation of loss and gain characteristics of an abnormal InxGa1-xAs/GaAs quantum well structure'. Together they form a unique fingerprint.

Cite this