Skip to main navigation Skip to search Skip to main content

Experimental Demonstration of NAND-Like Spin-Torque Memory Unit

  • Beihang University
  • Truth Memory Tech. Co. Ltd

Research output: Contribution to journalArticlepeer-review

Abstract

Current-induced magnetization switching is crucial in high-performance nonvolatile memory especially when the spin-Transfer torque (STT) and spin-orbit torque (SOT) are employed in the mainstream magnetic random-Access memory. However, in STT devices, the intrinsic mechanism leads to a long write latency, a low endurance, and a high-power consumption, while in SOT devices, a three-Terminal structure is necessary to complete the read and write operations, causing a low space efficiency. In this work, we experimentally demonstrate a NAND-like spin-Torque memory unit with the interplay of STT and SOT. The spin joint effect induced magnetic reversal is verified to be more energy-efficient and faster than that of STT. It also shows a great selectivity to ensure the reliability of the write operation. The memory unit, containing 8 magnetic tunnel junctions with a shared heavy-metal nanowire, is erased by a single SOT current and written by the combination of STT and SOT, showing the great potential for the high-density, ultrafast and energy efficient memory applications.

Original languageEnglish
Article number9352699
Pages (from-to)513-516
Number of pages4
JournalIEEE Electron Device Letters
Volume42
Issue number4
DOIs
StatePublished - Apr 2021

Keywords

  • Magnetic random-Access memory
  • NAND-like memory unit
  • spin-Transfer torque
  • spin-orbit torque

Fingerprint

Dive into the research topics of 'Experimental Demonstration of NAND-Like Spin-Torque Memory Unit'. Together they form a unique fingerprint.

Cite this