Skip to main navigation Skip to search Skip to main content

Event-driven fault tolerance for building nonstop active message programs

  • Chao Li
  • , Changhai Zhao
  • , Haihua Yan
  • , Jianlei Zhang
  • Beihang University
  • China National Petroleum Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the decreasing Mean Time Between Failures (MTBF) of high performance computing systems, process failure has become a normal phenomenon rather than an exception. The failures in high frequency lead to fault tolerance, a key feature of high performance applications. To provide fault tolerance interfaces for active message programs, this paper proposes a novel model called event-driven fault tolerance. The model converts each detected process failure into an event containing detailed failure information of the execution context, and then schedules the event up to application layer by executing user-directed event handlers to drive the program to recover from faults. Based on events, the model can provide applications with dynamic process groups and fault tolerant communication interfaces. We present an implementation of the model called EDFT (Event Driven Fault Tolerance) and describe its architecture, principle, components and application programming interfaces (API). To evaluate this model, we incorporate EDFT into a scientific application, PreStack Depth Migration (PSDM). Experiments are conducted by injecting various kinds of faults into PSDM when it is running. Experimental results show that for active message programs that demand high performance, event-driven fault tolerance model promises strong robustness, low overhead and high scalability.

Original languageEnglish
Title of host publicationProceedings - 2013 IEEE International Conference on High Performance Computing and Communications, HPCC 2013 and 2013 IEEE International Conference on Embedded and Ubiquitous Computing, EUC 2013
PublisherIEEE Computer Society
Pages382-390
Number of pages9
ISBN (Print)9780769550886
DOIs
StatePublished - 2014
Event15th IEEE International Conference on High Performance Computing and Communications, HPCC 2013 and 11th IEEE/IFIP International Conference on Embedded and Ubiquitous Computing, EUC 2013 - Zhangjiajie, Hunan, China
Duration: 13 Nov 201315 Nov 2013

Publication series

NameProceedings - 2013 IEEE International Conference on High Performance Computing and Communications, HPCC 2013 and 2013 IEEE International Conference on Embedded and Ubiquitous Computing, EUC 2013

Conference

Conference15th IEEE International Conference on High Performance Computing and Communications, HPCC 2013 and 11th IEEE/IFIP International Conference on Embedded and Ubiquitous Computing, EUC 2013
Country/TerritoryChina
CityZhangjiajie, Hunan
Period13/11/1315/11/13

Keywords

  • active messages
  • event-driven
  • fault tolerance
  • nonstop programs
  • reliability

Fingerprint

Dive into the research topics of 'Event-driven fault tolerance for building nonstop active message programs'. Together they form a unique fingerprint.

Cite this