Erratum: Integrated transmission-reflection strong-field terahertz time-domain spectroscopy (iScience (2025) 28(12), (S2589004225025246), (10.1016/j.isci.2025.114263))

(iScience 28, 114263, December 19, 2025) In the published article, the authors identified a minor graphical error in Figure 1. The orientation of the silicon wafer for beam-combining has a 90° deviation from the actual experimental setup. The redrawn figure correctly aligns the silicon wafer orientation with respect to the actual experiment. The error was identified post publication and only occurred during manuscript preparation during figure schematic drawing. This does not relate to experimental design, data collection, or analysis, nor does it affect the research conclusions, core data, or academic viewpoints of the paper. The scientific conclusion of the paper remains the same.[Figure