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EPIL-Attention: An Edge-Position-Illumination-Layout Guided Attention Mechanism for Fault Detection in Spinning Equipment Operation

  • Jiang Li*
  • , Kai Hu
  • , Jiehua Huang
  • , Pengkai Xia
  • , Yue Cai
  • , Yihang Ren
  • *Corresponding author for this work
  • Beihang University
  • Tianjin University

Research output: Contribution to journal › Conference article › peer-review

Abstract

In the automated production lines of the spinning industry, the operational status of equipment significantly impacts product quality, production efficiency, and safety. Existing deep learning detection algorithms, such as YOLO, perform well on natural images but face challenges like object edge truncation and metal reflection interference in spinning equipment fault detection. This paper proposes a novel attention mechanism - EPIL-Attention (Edge-Position-Illumination-Layout Attention) - designed to enhance the model's ability to capture structural features in spinning equipment images. EPIL-Attention comprises five parallel branches: horizontal structure perception, mid-section response, edge modeling, illumination adaptation, and spatial layout guidance. These are fused to output enhanced feature maps. We construct a real-world dataset and integrate EPIL-Attention into YOLOv11. Experiments demonstrate that EPIL-Attention consistently improves detection accuracy while maintaining practical deployment efficiency, thus showing promising detection performance and deployment potential.

Original languageEnglish
Pages (from-to)4318-4325
Number of pages8
JournalProceedings of the International Conference on Computer Supported Cooperative Work in Design, CSCWD
Issue number2026
DOIs
StatePublished - 2026
Event29th International Conference on Computer Supported Cooperative Work in Design, CSCWD 2026 - Fuzhou, China
Duration: 13 May 2026 → 15 May 2026

Keywords

  • EPIL-Attention
  • Equipment fault detection
  • Spinning industry

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