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Enhancing Reliability Assurance for DNN against Numerical Defect with Large Language Models

  • Jinyu Liu
  • , Jun Ai
  • , Haoran Su
  • , Tao Shi*
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Deep Neural Networks (DNNs) are increasingly deployed in safety-critical systems, yet their numerical reliability remains a pressing concern due to defects like NaN/INF occurrences during training/inference. Existing static analyzers detect operator-level risks but lack the ability to establish contextual mappings between operator-level anomalies and their originating code implementations, thereby limiting their practical applicability in real-world debugging scenarios. To address this limitation, this paper introduces a novel hybrid method that synergizes risk sensitive paths derived from static analysis with Large Language Model(LLM)-guided semantic reasoning. By anchoring LLMs to identified risk-sensitive computation paths, the proposed method precisely correlates operator-level numerical defects with code-level vulnerabilities, while mitigating LLM hallucinations. Evaluated on a widely-used real-world benchmark, the proposed method achieves 100% defect detection accuracy, matching state-of-the-art static analyzers, but significantly outperforms them in code-level root-cause localization. This work pioneers a new paradigm for DNN reliability assurance by combining the static numerical analysis with the semantic reasoning power of LLMs, establishing a practical numerical defect analysis pipeline.

Original languageEnglish
Title of host publicationProceedings - 2025 IEEE 36th International Symposium on Software Reliability Engineering, ISSRE 2025
PublisherIEEE Computer Society
Pages300-310
Number of pages11
ISBN (Electronic)9798350393026
DOIs
StatePublished - 2025
Event36th IEEE International Symposium on Software Reliability Engineering, ISSRE 2025 - Sao Paulo, Brazil
Duration: 21 Oct 2025 → 24 Oct 2025

Publication series

NameProceedings - International Symposium on Software Reliability Engineering, ISSRE
ISSN (Print)1071-9458

Conference

Conference36th IEEE International Symposium on Software Reliability Engineering, ISSRE 2025
Country/TerritoryBrazil
CitySao Paulo
Period21/10/25 → 24/10/25

Keywords

  • Deep Neural Networks
  • Defect Detection
  • DNN Numerical Defects
  • Large Language Models

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