Engineering and technology for low-altitude economy infrastructure

Zhijie Chen; Heung Yeung Shum; Xianbin Cao; Mark Hansen

doi:10.1631/FITEE.2530000

Engineering and technology for low-altitude economy infrastructure

Zhijie Chen^*
, Heung Yeung Shum
, Xianbin Cao
, Mark Hansen

^*Corresponding author for this work

School of Electronic and Information Engineering

State Key Laboratory of Air Traffic Management System and Technology
International Digital Economy Academy
University of California at Berkeley

Research output: Contribution to journal › Editorial

2 Scopus citations

Original language	English
Pages (from-to)	2393-2396
Number of pages	4
Journal	Frontiers of Information Technology and Electronic Engineering
Volume	26
Issue number	12
DOIs	https://doi.org/10.1631/FITEE.2530000
State	Published - Dec 2025

Access to Document

10.1631/FITEE.2530000

Cite this

@article{e5db0cbf619646e39ea6f0217cff4977,

title = "Engineering and technology for low-altitude economy infrastructure",

author = "Zhijie Chen and Shum, \{Heung Yeung\} and Xianbin Cao and Mark Hansen",

year = "2025",

month = dec,

doi = "10.1631/FITEE.2530000",

language = "英语",

volume = "26",

pages = "2393--2396",

journal = "Frontiers of Information Technology and Electronic Engineering",

issn = "2095-9184",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "12",

}

TY - JOUR

T1 - Engineering and technology for low-altitude economy infrastructure

AU - Chen, Zhijie

AU - Shum, Heung Yeung

AU - Cao, Xianbin

AU - Hansen, Mark

PY - 2025/12

Y1 - 2025/12

UR - https://www.scopus.com/pages/publications/105025724024

U2 - 10.1631/FITEE.2530000

DO - 10.1631/FITEE.2530000

M3 - 社论

AN - SCOPUS:105025724024

SN - 2095-9184

VL - 26

SP - 2393

EP - 2396

JO - Frontiers of Information Technology and Electronic Engineering

JF - Frontiers of Information Technology and Electronic Engineering

IS - 12

ER -

Engineering and technology for low-altitude economy infrastructure

Access to Document

Other files and links

Cite this