Abstract
The thickness of SnO2 buffer layers has been found to considerably affect the structure and magnetic properties of Sn 1 -xCox O2 films. As the buffer-layer thickness increases, the lattice constant a and Co-O bond length of the Sn 1 -xCox O2 films contract, which suggest the gradual relaxation of the accumulated tensile strain. Simultaneously, the amount of structural defects in Sn1 -xCoxO2 films decreases significantly and the grain size increases with increasing buffer-layer thickness. All the Sn1 -xCoxO2 films exhibit intrinsic ferromagnetism at room temperature and the saturated magnetic moment varies with the buffer-layer thickness. The dependence of ferromagnetism on the buffer-layer thickness can be explained on the basis of the variations in the density of structural defects and Co-O bond length in Sn1 -xCoxO2 films.
| Original language | English |
|---|---|
| Article number | 6028007 |
| Pages (from-to) | 3999-4002 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 47 |
| Issue number | 10 |
| DOIs | |
| State | Published - Oct 2011 |
Keywords
- Diluted magnetic oxide
- buffer layer
- lattice strain
- structural defects
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