Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance

Bei Zhang; Peng Yan; Le Wang; Chengqian Zhang

doi:10.1109/PIERS.2016.7734487

Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance

Bei Zhang
, Peng Yan
, Le Wang
, Chengqian Zhang

School of Automation Science and Electrical Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.

Original language	English
Title of host publication	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	818-822
Number of pages	5
ISBN (Electronic)	9781509060931
DOIs	https://doi.org/10.1109/PIERS.2016.7734487
State	Published - 3 Nov 2016
Event	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Shanghai, China Duration: 8 Aug 2016 → 11 Aug 2016

Publication series

Name	2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

Conference

Conference	2016 Progress In Electromagnetics Research Symposium, PIERS 2016
Country/Territory	China
City	Shanghai
Period	8/08/16 → 11/08/16

Access to Document

10.1109/PIERS.2016.7734487

Cite this

Zhang, B., Yan, P., Wang, L., & Zhang, C. (2016). Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance. In 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings (pp. 818-822). Article 7734487 (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PIERS.2016.7734487

Zhang, Bei ; Yan, Peng ; Wang, Le et al. / Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance. 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 818-822 (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings).

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title = "Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance",

abstract = "Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.",

author = "Bei Zhang and Peng Yan and Le Wang and Chengqian Zhang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 ; Conference date: 08-08-2016 Through 11-08-2016",

year = "2016",

month = nov,

day = "3",

doi = "10.1109/PIERS.2016.7734487",

language = "英语",

series = "2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "818--822",

booktitle = "2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings",

address = "美国",

}

Zhang, B, Yan, P, Wang, L & Zhang, C 2016, Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance. in 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings., 7734487, 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 818-822, 2016 Progress In Electromagnetics Research Symposium, PIERS 2016, Shanghai, China, 8/08/16. https://doi.org/10.1109/PIERS.2016.7734487

Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance. / Zhang, Bei; Yan, Peng; Wang, Le et al.
2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2016. p. 818-822 7734487 (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance

AU - Zhang, Bei

AU - Yan, Peng

AU - Wang, Le

AU - Zhang, Chengqian

PY - 2016/11/3

Y1 - 2016/11/3

N2 - Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.

AB - Interferometric Surface Plasmons (SPs) microscopic sensing can be used to measure the thickness or refractive index variation of nanomaterial within the order of diffraction limit in the lateral directions. However experimental results in literatures have shown the technique suffers from severely low signal to noise ratio (SNR) which limits its practical resolution and may cause failure of the technique in some hostile environment. In this paper, we study the effect of finite numerical aperture (NA) on the interferometric SPs sensing performance and explore the possibility of imposing proper pupil apodization functions to suppress the effect. We also propose a TM-only mode apodization filter to further improve the sensing performance of the interferometric SPs microscopy.

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DO - 10.1109/PIERS.2016.7734487

M3 - 会议稿件

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T3 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

SP - 818

EP - 822

BT - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 Progress In Electromagnetics Research Symposium, PIERS 2016

Y2 - 8 August 2016 through 11 August 2016

ER -

Zhang B, Yan P, Wang L, Zhang C. Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance. In 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2016. p. 818-822. 7734487. (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings). doi: 10.1109/PIERS.2016.7734487

Effect of finite aperture on Interferometric Surface Plasmon microscopic sensing performance

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