Skip to main navigation Skip to search Skip to main content

Edge enhanced morphology for infrared image analysis

  • Xiangzhi Bai*
  • , Haonan Liu
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journal › Article › peer-review

Abstract

Edge information is one of the critical information for infrared images. Morphological operators have been widely used for infrared image analysis. However, the edge information in infrared image is weak and the morphological operators could not well utilize the edge information of infrared images. To strengthen the edge information in morphological operators, the edge enhanced morphology is proposed in this paper. Firstly, the edge enhanced dilation and erosion operators are given and analyzed. Secondly, the pseudo operators which are derived from the edge enhanced dilation and erosion operators are defined. Finally, the applications for infrared image analysis are shown to verify the effectiveness of the proposed edge enhanced morphological operators. The proposed edge enhanced morphological operators are useful for the applications related to edge features, which could be extended to wide area of applications.

Original languageEnglish
Pages (from-to)44-57
Number of pages14
JournalInfrared Physics and Technology
Volume80
DOIs
StatePublished - 1 Jan 2017

Keywords

  • Dilation
  • Edge enhanced morphology
  • Erosion
  • Infrared image analysis
  • Mathematical morphology

Fingerprint

Dive into the research topics of 'Edge enhanced morphology for infrared image analysis'. Together they form a unique fingerprint.

Cite this