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Edge-Assisted Epipolar Transformer for Industrial Scene Reconstruction

  • Wei Tong
  • , Xiaorong Guan
  • , Miaomiao Zhang
  • , Ping Li*
  • , Jin Ma*
  • , Edmond Q. Wu*
  • , Li Min Zhu
  • *Corresponding author for this work
  • Nanjing University of Posts and Telecommunications
  • Nanjing University of Science and Technology
  • Shanghai Jiao Tong University
  • Air Force Medical University

Research output: Contribution to journalArticlepeer-review

Abstract

Given a set of calibrated images, Multiple View Stereo (MVS) applies end-to-end depth inference network to recover scene structure. However, previous methods designed pixel-visibility modules to aggregate cross-view cost, ignoring the consistency assumption of 2D contextual features in the 3D depth direction. The current multi-stage depth inference model also relies on intensive depth samples, which requires high memory consumption. To alleviate these problems, this work exploits edge-assisted epipolar Transformer for multi-view depth inference. The improvements of this work are summarized as follows: 1) The epipolar Transformer block is developed for reliable cross-view cost aggregation, and the edge detection branch is designed to constrain the consistency of epipolar geometry and edge features. 2) The dynamic depth range sampling mechanism based on probability volume is adopted to improve the accuracy of uncertain areas. Comprehensive comparisons with the state-of-the-art works indicate that our work can reconstruct dense scene representations with limited memory bottleblock.

Original languageEnglish
Pages (from-to)701-711
Number of pages11
JournalIEEE Transactions on Automation Science and Engineering
Volume22
DOIs
StatePublished - 2025

Keywords

  • MVS
  • cost aggregation
  • depth inference
  • epipolar transformer

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