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Dynamic Zero Current Method to Reduce Measurement Error in Low Value Resistive Sensor Array for Wearable Electronics

  • Huanqian Zhang
  • , Jee Chin Teoh
  • , Jianfeng Wu*
  • , Longteng Yu
  • , Chwee Teck Lim*
  • *Corresponding author for this work
  • National University of Singapore
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • China Nanhu Academy of Electronics and Information Technology
  • Southeast University, Nanjing
  • Zhejiang Lab

Research output: Contribution to journalArticlepeer-review

Abstract

One advantage of a resistive sensor array (RSA) with shared rows (M) and shared columns (N) is the reduced number of wires from M × N + 1 to M + N which can greatly lessen the complexity and burden on wearable electronic systems. However, the drawback is the crosstalk current effect between adjacent elements, which will lead to high measurement error. Although several solutions have been reported, they mainly focus on RSAs with high resistance (≥100 Ω). There is a lack of research that addresses RSAs with resistor values below 100 Ω. Here, we introduce a new circuit design named the dynamic zero current method (DZCM) to further decrease the measurement error. From the low value RSA test with ideal resistors, the DZCM exhibits lower error than the zero potential method (ZPM). In the case of the error variation ratio of amplifier offset voltage, the DZCM has a 4%/mV (row) to 7%/mV (column) ratio, while the ZPM has an almost 25%/mV (row) to 45%/mV (column) ratio and it increases with array size.

Original languageEnglish
Article number1406
JournalSensors
Volume23
Issue number3
DOIs
StatePublished - Feb 2023
Externally publishedYes

Keywords

  • dynamical zero current
  • input offset voltage
  • low value resistive sensor array
  • measurement error
  • parasitic resistance
  • zero potential method

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