Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

Wei Wang; Jian Qiang Qian; Ying Zi Li; Zhu Li Chen

doi:10.1088/0256-307X/30/6/060702

Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

Wei Wang
, Jian Qiang Qian^*
, Ying Zi Li
, Zhu Li Chen

^*Corresponding author for this work

School of Physics

Beihang University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

Original language	English
Article number	060702
Journal	Chinese Physics Letters
Volume	30
Issue number	6
DOIs	https://doi.org/10.1088/0256-307X/30/6/060702
State	Published - Jun 2013

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title = "Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform",

abstract = "A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.",

author = "Wei Wang and Qian, \{Jian Qiang\} and Li, \{Ying Zi\} and Chen, \{Zhu Li\}",

year = "2013",

month = jun,

doi = "10.1088/0256-307X/30/6/060702",

language = "英语",

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AU - Wang, Wei

AU - Qian, Jian Qiang

AU - Li, Ying Zi

AU - Chen, Zhu Li

PY - 2013/6

Y1 - 2013/6

N2 - A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

AB - A dual-frequency atomic force microscopy imaging system is set up to enhance the amplitude of higher harmonic signals. The experimental results of the dual-frequency imaging technology are given. Normally the image of the higher harmonic is helpful to optimize the imaging conditions in tapping mode and allows one to differentiate qualitatively between dissimilar materials that are hardly distinguishable by traditional atomic force microscopy.

UR - https://www.scopus.com/pages/publications/84879908528

U2 - 10.1088/0256-307X/30/6/060702

DO - 10.1088/0256-307X/30/6/060702

M3 - 文章

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VL - 30

JO - Chinese Physics Letters

JF - Chinese Physics Letters

IS - 6

M1 - 060702

ER -

Dual-frequency atomic force microscopy imaging method and experiment based on commercial AFM platform

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