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DIVE: Dynamic Information-Guided Variable Expansion for Deeper Analog Circuit Optimization

  • Zhuohua Liu
  • , Weilun Xie
  • , Yuxuan Zhang
  • , Chen Wang
  • , Yuanqi Hu*
  • , Wei W. Xing*
  • *Corresponding author for this work
  • Beihang University
  • Shenzhen University
  • University of Sheffield

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In analog circuit design, transistor sizing remains a critical challenge due to high-dimensional parameter spaces and expensive simulations. While Bayesian optimization shows promise, existing methods struggle with the "curse of dimensionality."Inspired by expert designers' workflow of focusing on key parameters first before gradually optimizing secondary parameters, we introduce DIVE (Dynamic Information-guided Variable Expansion), a framework that reformulates parameter optimization as an information efficiency maximization problem. Unlike approaches that explore all parameters simultaneously, DIVE progressively includes design variables with the highest information content. Our framework introduces three innovations: (1) constraint-aware weighted mutual information analysis that evaluates parameters' contributions to objectives and constraints; (2) an adaptive variable inclusion mechanism that determines when to expand the optimization space; and (3) a mutual information-guided kernel learning strategy for Gaussian process models. Evaluations across multiple analog circuits demonstrate that DIVE achieves a 1.61×-21.11× reduction in required simulations while delivering up to 2.69× spec improvements over the state-of-the-art methods. By progressing from simple to complex parameter spaces based on information theory, DIVE establishes a new paradigm for reaching deeper optima by mimicking experienced designers' design philosophy in circuit optimization.

Original languageEnglish
Title of host publication2025 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331515607
DOIs
StatePublished - 2025
Event44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Munich, Germany
Duration: 26 Oct 2025 → 30 Oct 2025

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference44th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025
Country/TerritoryGermany
CityMunich
Period26/10/25 → 30/10/25

Keywords

  • Bayesian Optimization
  • Constrained Optimization
  • Transistor Sizing

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