Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

Yuanhong Yang; Hongtao Yu

Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

Yuanhong Yang^*
, Hongtao Yu

^*Corresponding author for this work

School of Instrumentation and Optoelectronic Engineering

Beihang University

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

Original language	English
Pages (from-to)	640-642
Number of pages	3
Journal	Chinese Optics Letters
Volume	2
Issue number	11
State	Published - Nov 2004

Cite this

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title = "Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit",

abstract = "A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.",

author = "Yuanhong Yang and Hongtao Yu",

year = "2004",

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language = "英语",

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journal = "Chinese Optics Letters",

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T1 - Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

AU - Yang, Yuanhong

AU - Yu, Hongtao

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N2 - A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

AB - A high-precision digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuits is proposed. This scheme is based on Sagnac interferometer modulated with digital step waveform whose frequency is half of eigen frequency of the interferometer. The technology and measuring precision are discussed. An experimental setup is made and the temperature-dependences of half-wave voltage of two samples are studied. Analysis and experimental study prove that this scheme is convenient and accurate.

UR - https://www.scopus.com/pages/publications/11844290140

M3 - 文章

AN - SCOPUS:11844290140

SN - 1671-7694

VL - 2

SP - 640

EP - 642

JO - Chinese Optics Letters

JF - Chinese Optics Letters

IS - 11

ER -

Digital measuring scheme for half-wave voltage of Y-tap multiple integrated optical circuit

Abstract

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