Development of open architecture test systems

Diyin Tang; Jinsong Yu; Xiongzi Chen; Honglun Wang

doi:10.1109/ICEMI.2011.6037763

Development of open architecture test systems

Diyin Tang^*
, Jinsong Yu
, Xiongzi Chen
, Honglun Wang

^*Corresponding author for this work

School of Automation Science and Electrical Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.

Original language	English
Title of host publication	Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Pages	51-54
Number of pages	4
DOIs	https://doi.org/10.1109/ICEMI.2011.6037763
State	Published - 2011
Event	IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 - Chengdu, China Duration: 16 Aug 2011 → 18 Aug 2011

Publication series

Name	Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Volume	2

Conference

Conference	IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Country/Territory	China
City	Chengdu
Period	16/08/11 → 18/08/11

Keywords

ATE
ATE software technologies
application-oriented
open architecture

Access to Document

10.1109/ICEMI.2011.6037763

Cite this

Tang, D., Yu, J., Chen, X., & Wang, H. (2011). Development of open architecture test systems. In Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 (pp. 51-54). Article 6037763 (Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011; Vol. 2). https://doi.org/10.1109/ICEMI.2011.6037763

@inproceedings{8cfc1b67ead443d582941b5859d84015,

title = "Development of open architecture test systems",

abstract = "Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS \& instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.",

keywords = "ATE, ATE software technologies, application-oriented, open architecture",

author = "Diyin Tang and Jinsong Yu and Xiongzi Chen and Honglun Wang",

year = "2011",

doi = "10.1109/ICEMI.2011.6037763",

language = "英语",

isbn = "9781424481590",

series = "Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011",

pages = "51--54",

booktitle = "Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011",

note = "IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011 ; Conference date: 16-08-2011 Through 18-08-2011",

}

Tang, D , Yu, J, Chen, X & Wang, H 2011, Development of open architecture test systems. in Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011., 6037763, Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011, vol. 2, pp. 51-54, IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011, Chengdu, China, 16/08/11. https://doi.org/10.1109/ICEMI.2011.6037763

Development of open architecture test systems. / Tang, Diyin ; Yu, Jinsong; Chen, Xiongzi et al.
Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011. 2011. p. 51-54 6037763 (Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

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AU - Yu, Jinsong

AU - Chen, Xiongzi

AU - Wang, Honglun

PY - 2011

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N2 - Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.

AB - Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.

KW - ATE

KW - ATE software technologies

KW - application-oriented

KW - open architecture

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DO - 10.1109/ICEMI.2011.6037763

M3 - 会议稿件

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SN - 9781424481590

T3 - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

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BT - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

T2 - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011

Y2 - 16 August 2011 through 18 August 2011

ER -

Development of open architecture test systems

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Keywords

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