Development of High Power Electron Beam Measuring and Analyzing System for Microwave Vacuum Electron Devices

The measurement and analysis of high power electron beam during its formation and transmission are the basic scientific problems and key techniques for the development of high performance microwave vacuum electron devices, which are widely used in the fields of military weapon, microwave system and scientific instruments. In this paper, the dynamic parameters measurement and analysis system being built in Institute of Electronics, Chinese Academy of Sciences (IECAS) recently are introduced. The instrument are designed to determine the cross-section, the current density, and the energy resolution of the high power electron beam during its formation and transmission process, which are available both for the electron gun and the electron optics system respectively. Then the three dimension trajectory images of the electron beam can be rebuilt and display with computer controlled data acquisition and processing system easily. Thus, much more complicated structures are considered and solved completely to achieve its detection and analysis, such as big chamber with 10^-6 Pa high vacuum system, the controlled detector movement system in axis direction with distance of 600 mm inside the vacuum chamber, the electron beam energy analysis system with high resolution of 0.5%, and the electron beam cross-section and density detector using the YAG: Ce crystal and CCD imaging system et al. At present, the key parts of the instrument have been finished, the cross-section experiment of the electron beam have been performed successfully. Hereafter, the instrument will be used to measure and analyze the electron beam with the electron gun and electron optics system for the single beam and multiple beam klystron, gyrotron, sheet beam device, and traveling wave tube etc. thoroughly.