TY - GEN
T1 - Design of the in-situ testing system for the accelerated life test of the space infrared device
AU - Zhu, Xianliang
AU - Zhang, Haiyan
AU - Wang, Yang
AU - He, Xiangrong
AU - Gong, Haimei
PY - 2013
Y1 - 2013
N2 - Space infrared detector is the core component of photoelectric conversion in the infrared system, the indicator of which, such as sensibility and reliability, limits the optimum performance of the detection system. In the reliability research of infrared detector, the operating life of the device is a very important index and also a significant subject in the engineering application. In the accelerated life test of space infrared detector, it was difficult to periodically measure blackbody response signal of infrared detector, due to equipment limitations for a long time. Accordingly, it was also hard to get abundant failure data of devices for statistical analysis. For this problem, we designed a novel multi-station testing system for accelerated life test of space infrared device, in which response signal as well as temperature can be measured in-situ and recorded for further analysis. Based on theoretical calculation and analysis of actual measured data, we studied and designed the mechanical structure of the equipment and the key component of the testing system, such as the displacement platform, illustrated the control algorithm and put up a system design proposal which meet the testing requirements well. This work technically supports the accelerated life test of space infrared device.
AB - Space infrared detector is the core component of photoelectric conversion in the infrared system, the indicator of which, such as sensibility and reliability, limits the optimum performance of the detection system. In the reliability research of infrared detector, the operating life of the device is a very important index and also a significant subject in the engineering application. In the accelerated life test of space infrared detector, it was difficult to periodically measure blackbody response signal of infrared detector, due to equipment limitations for a long time. Accordingly, it was also hard to get abundant failure data of devices for statistical analysis. For this problem, we designed a novel multi-station testing system for accelerated life test of space infrared device, in which response signal as well as temperature can be measured in-situ and recorded for further analysis. Based on theoretical calculation and analysis of actual measured data, we studied and designed the mechanical structure of the equipment and the key component of the testing system, such as the displacement platform, illustrated the control algorithm and put up a system design proposal which meet the testing requirements well. This work technically supports the accelerated life test of space infrared device.
KW - Accelerated life test
KW - Automatic test
KW - Infrared detector
KW - Response signal
UR - https://www.scopus.com/pages/publications/84896530811
U2 - 10.1117/12.2034897
DO - 10.1117/12.2034897
M3 - 会议稿件
AN - SCOPUS:84896530811
SN - 9780819497765
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - International Symposium on Photoelectronic Detection and Imaging 2013
PB - SPIE
T2 - 5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013
Y2 - 25 June 2013 through 27 June 2013
ER -