Design of Gamma control charts based on the narrowest confidence interval

Songhua Hao; Shuo Huang; Jun Yang

doi:10.1109/IEEM.2016.7797868

Design of Gamma control charts based on the narrowest confidence interval

Songhua Hao
, Shuo Huang
, Jun Yang

School of Reliability and Systems Engineering

Beihang University
City University of Hong Kong

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

In statistical process control, Gamma control charts are often designed for time-between-events (TBEs) monitoring. For Gamma distribution, the traditional equal-tail probability limits lead to the problem that some out-of-control events may occur in higher probability than in-control events. To overcome this problem, Gamma control limits with known parameters are proposed based on the narrowest confidence interval. Simulation and case study show that the proposed Gamma control limits outperform the conventional equal-tail probability limits, since the proposed Gamma control charts have shorter width and are more sensitive to detect the increase of parameter θ than the traditional ones.

Original language	English
Title of host publication	2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016
Publisher	IEEE Computer Society
Pages	219-223
Number of pages	5
ISBN (Electronic)	9781509036653
DOIs	https://doi.org/10.1109/IEEM.2016.7797868
State	Published - 27 Dec 2016
Event	2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016 - Bali, Indonesia Duration: 4 Dec 2016 → 7 Dec 2016

Publication series

Name	IEEE International Conference on Industrial Engineering and Engineering Management
Volume	2016-December
ISSN (Print)	2157-3611
ISSN (Electronic)	2157-362X

Conference

Conference	2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016
Country/Territory	Indonesia
City	Bali
Period	4/12/16 → 7/12/16

Keywords

equal-tail probability limits
Gamma control charts
narrowest confidence interval
statistical process control
time-between-events

Access to Document

10.1109/IEEM.2016.7797868

Cite this

Hao, S., Huang, S., & Yang, J. (2016). Design of Gamma control charts based on the narrowest confidence interval. In 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016 (pp. 219-223). Article 7797868 (IEEE International Conference on Industrial Engineering and Engineering Management; Vol. 2016-December). IEEE Computer Society. https://doi.org/10.1109/IEEM.2016.7797868

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title = "Design of Gamma control charts based on the narrowest confidence interval",

abstract = "In statistical process control, Gamma control charts are often designed for time-between-events (TBEs) monitoring. For Gamma distribution, the traditional equal-tail probability limits lead to the problem that some out-of-control events may occur in higher probability than in-control events. To overcome this problem, Gamma control limits with known parameters are proposed based on the narrowest confidence interval. Simulation and case study show that the proposed Gamma control limits outperform the conventional equal-tail probability limits, since the proposed Gamma control charts have shorter width and are more sensitive to detect the increase of parameter θ than the traditional ones.",

keywords = "equal-tail probability limits, Gamma control charts, narrowest confidence interval, statistical process control, time-between-events",

author = "Songhua Hao and Shuo Huang and Jun Yang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016 ; Conference date: 04-12-2016 Through 07-12-2016",

year = "2016",

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doi = "10.1109/IEEM.2016.7797868",

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Hao, S, Huang, S & Yang, J 2016, Design of Gamma control charts based on the narrowest confidence interval. in 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016., 7797868, IEEE International Conference on Industrial Engineering and Engineering Management, vol. 2016-December, IEEE Computer Society, pp. 219-223, 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016, Bali, Indonesia, 4/12/16. https://doi.org/10.1109/IEEM.2016.7797868

Design of Gamma control charts based on the narrowest confidence interval. / Hao, Songhua; Huang, Shuo; Yang, Jun.
2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016. IEEE Computer Society, 2016. p. 219-223 7797868 (IEEE International Conference on Industrial Engineering and Engineering Management; Vol. 2016-December).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Yang, Jun

PY - 2016/12/27

Y1 - 2016/12/27

N2 - In statistical process control, Gamma control charts are often designed for time-between-events (TBEs) monitoring. For Gamma distribution, the traditional equal-tail probability limits lead to the problem that some out-of-control events may occur in higher probability than in-control events. To overcome this problem, Gamma control limits with known parameters are proposed based on the narrowest confidence interval. Simulation and case study show that the proposed Gamma control limits outperform the conventional equal-tail probability limits, since the proposed Gamma control charts have shorter width and are more sensitive to detect the increase of parameter θ than the traditional ones.

AB - In statistical process control, Gamma control charts are often designed for time-between-events (TBEs) monitoring. For Gamma distribution, the traditional equal-tail probability limits lead to the problem that some out-of-control events may occur in higher probability than in-control events. To overcome this problem, Gamma control limits with known parameters are proposed based on the narrowest confidence interval. Simulation and case study show that the proposed Gamma control limits outperform the conventional equal-tail probability limits, since the proposed Gamma control charts have shorter width and are more sensitive to detect the increase of parameter θ than the traditional ones.

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KW - Gamma control charts

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KW - statistical process control

KW - time-between-events

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BT - 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016

PB - IEEE Computer Society

T2 - 2016 International Conference on Industrial Engineering and Engineering Management, IEEM 2016

Y2 - 4 December 2016 through 7 December 2016

ER -

Design of Gamma control charts based on the narrowest confidence interval

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