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Design of compliant parallel mechanism for Nanoimprint Lithography

  • Xiantao Sun*
  • , Weihai Chen
  • , Rui Zhou
  • , Jianbin Zhang
  • , Wenjie Chen
  • *Corresponding author for this work
  • Beihang University
  • Agency for Science, Technology and Research, Singapore

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Nanoimprint Lithography (NIL) is an emerging alternative lithography technology that can be repeated to print nanometer-scale geometries which have very good uniformity and repeatability. The compliant mechanism is a novel mechanism which has been utilized in many accurate mechanisms and precise instruments because of its obvious advantages such as easy assembly, zero friction, zero lubrication, low cost, monolithic manufacturing and reduced weight, etc. This paper mainly introduces the application of compliant mechanisms in NIL and analysis and design of several novel compliant mechanisms.

Original languageEnglish
Title of host publicationProceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
Pages200-205
Number of pages6
DOIs
StatePublished - 2011
Event2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011 - Beijing, China
Duration: 21 Jun 2011 → 23 Jun 2011

Publication series

NameProceedings of the 2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011

Conference

Conference2011 6th IEEE Conference on Industrial Electronics and Applications, ICIEA 2011
Country/TerritoryChina
CityBeijing
Period21/06/11 → 23/06/11

Keywords

  • compliant parallel mechanism
  • flexure hinge
  • Nanoimprint Lithography (NIL)
  • non-linear analysis

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