TY - GEN
T1 - Delaunay Triangulation-based hazard area avoidance for spacecraft safe landing
AU - Fei, Simiao
AU - Zhao, Yu
AU - Yang, Jun
AU - Huo, Lin
PY - 2011
Y1 - 2011
N2 - Safe landing for spacecraft on moon or the other planets is the basic premise for carrying on field survey and sampling research. When it comes to the spacecraft safe landing, the environment the spacecraft confronts becomes more complex. So the selection of landing area would influence the success landing probability of the spacecraft directly. The paper stands in reality and takes the factors such as craters and stones into account abundantly, which affect safe landing for spacecraft. Considering of the radiuses of obstacle spots (craters and stones) and the edge conditions of predestination landing area, we could find out the optimal landing area with the help of Delaunay Triangulation.
AB - Safe landing for spacecraft on moon or the other planets is the basic premise for carrying on field survey and sampling research. When it comes to the spacecraft safe landing, the environment the spacecraft confronts becomes more complex. So the selection of landing area would influence the success landing probability of the spacecraft directly. The paper stands in reality and takes the factors such as craters and stones into account abundantly, which affect safe landing for spacecraft. Considering of the radiuses of obstacle spots (craters and stones) and the edge conditions of predestination landing area, we could find out the optimal landing area with the help of Delaunay Triangulation.
KW - Delaunay Triangulation
KW - Optimal landing area
KW - Safe landing
UR - https://www.scopus.com/pages/publications/78651297108
U2 - 10.4028/www.scientific.net/AMM.44-47.3721
DO - 10.4028/www.scientific.net/AMM.44-47.3721
M3 - 会议稿件
AN - SCOPUS:78651297108
SN - 9783037850046
T3 - Applied Mechanics and Materials
SP - 3721
EP - 3725
BT - Frontiers of Manufacturing and Design Science
T2 - 2010 International Conference on Frontiers of Manufacturing and Design Science, ICFMD2010
Y2 - 11 December 2010 through 12 December 2010
ER -