Degradation Analysis for Reliability of Optoelectronics

Cheng Qian; Zeyu Wu; Wei Chen; Jiajie Fan; Xi Yang; Yi Ren; Bo Sun; Zili Wang

doi:10.1007/978-3-030-81576-9_11

Degradation Analysis for Reliability of Optoelectronics

Cheng Qian^*
, Zeyu Wu
, Wei Chen
, Jiajie Fan
, Xi Yang
, Yi Ren
, Bo Sun
, Zili Wang

^*Corresponding author for this work

School of Reliability and Systems Engineering

Shenzhen Institute of Wide-Bandgap Semiconductors
Fudan University
Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Abstract

With an ever-improving advancement of packaging technology, the current available optoelectronics are not likely to fail by catastrophic failures but exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-based model for lumen depreciation and CCT shift, and spectral power distribution-based model for lumen depreciation and color shift, to achieve multifarious reliability assessments for the optoelectronics.

Original language	English
Title of host publication	Reliability of Organic Compounds in Microelectronics and Optoelectronics
Subtitle of host publication	From Physics-of-Failure to Physics-of-Degradation
Publisher	Springer International Publishing
Pages	317-350
Number of pages	34
ISBN (Electronic)	9783030815769
ISBN (Print)	9783030815752
DOIs	https://doi.org/10.1007/978-3-030-81576-9_11
State	Published - 1 Jan 2022

Keywords

Degradation Modeling
Exponential Decay
Gamma Process
Optoelectronics
Spectral Power Distribution

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10.1007/978-3-030-81576-9_11

Cite this

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title = "Degradation Analysis for Reliability of Optoelectronics",

abstract = "With an ever-improving advancement of packaging technology, the current available optoelectronics are not likely to fail by catastrophic failures but exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-based model for lumen depreciation and CCT shift, and spectral power distribution-based model for lumen depreciation and color shift, to achieve multifarious reliability assessments for the optoelectronics.",

keywords = "Degradation Modeling, Exponential Decay, Gamma Process, Optoelectronics, Spectral Power Distribution",

author = "Cheng Qian and Zeyu Wu and Wei Chen and Jiajie Fan and Xi Yang and Yi Ren and Bo Sun and Zili Wang",

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T1 - Degradation Analysis for Reliability of Optoelectronics

AU - Qian, Cheng

AU - Wu, Zeyu

AU - Chen, Wei

AU - Fan, Jiajie

AU - Yang, Xi

AU - Ren, Yi

AU - Sun, Bo

AU - Wang, Zili

PY - 2022/1/1

Y1 - 2022/1/1

N2 - With an ever-improving advancement of packaging technology, the current available optoelectronics are not likely to fail by catastrophic failures but exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-based model for lumen depreciation and CCT shift, and spectral power distribution-based model for lumen depreciation and color shift, to achieve multifarious reliability assessments for the optoelectronics.

AB - With an ever-improving advancement of packaging technology, the current available optoelectronics are not likely to fail by catastrophic failures but exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-based model for lumen depreciation and CCT shift, and spectral power distribution-based model for lumen depreciation and color shift, to achieve multifarious reliability assessments for the optoelectronics.

KW - Degradation Modeling

KW - Exponential Decay

KW - Gamma Process

KW - Optoelectronics

KW - Spectral Power Distribution

UR - https://www.scopus.com/pages/publications/85153806328

U2 - 10.1007/978-3-030-81576-9_11

DO - 10.1007/978-3-030-81576-9_11

M3 - 章节

AN - SCOPUS:85153806328

SN - 9783030815752

SP - 317

EP - 350

BT - Reliability of Organic Compounds in Microelectronics and Optoelectronics

PB - Springer International Publishing

ER -

Degradation Analysis for Reliability of Optoelectronics

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Keywords

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