Defects simulation of optocoupler based on low-frequency noise analysis

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Optocoupler is widely used in the field of aerospace and military, its reliability is attached more importance Current transfer ratio (CTR) is a conventional electric parameter used to evaluate its reliability. But it can not reflect microscopic changes of device internal defects directly. In order to study the influence of defects to output noise, defects simulation of optocoupler based on low-frequency noise analysis was presented in this paper. Firstly, optocoupler Defects was analyzed By formulas derivation, the relationship between low frequency noise and defects was obtained An equivalent model of optocoupler was built on the foundation of noise characteristic. Parameters can be adjusted according to equipment or data sheet Finally output noise and CTR were analyzed via changing parameters inner the test circuit. It can be seen from the simulation results that when defects amplified and traps inner optocoupler increased, the output noise is responded sensitively, 1/f noise increased along with the number of defects in low frequency range. Simulation results indicated that the method used low frequency noise as an effective way to evaluate the reliability of optocoupler presented in this paper is feasible.

Original languageEnglish
Title of host publicationProceedings of 2014 Prognostics and System Health Management Conference, PHM 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages46-50
Number of pages5
ISBN (Electronic)9781479979585
DOIs
StatePublished - 16 Dec 2014
Event2014 Prognostics and System Health Management Conference, PHM 2014 - Zhangiiaijie City, China
Duration: 24 Aug 201427 Aug 2014

Publication series

NameProceedings of 2014 Prognostics and System Health Management Conference, PHM 2014

Conference

Conference2014 Prognostics and System Health Management Conference, PHM 2014
Country/TerritoryChina
CityZhangiiaijie City
Period24/08/1427/08/14

Keywords

  • defect
  • low-frequency noise
  • optocoupler
  • pspice simulation
  • reliability

Fingerprint

Dive into the research topics of 'Defects simulation of optocoupler based on low-frequency noise analysis'. Together they form a unique fingerprint.

Cite this