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DEEPFAKE DETECTION VIA SEPARABLE SELF-CONSISTENCY LEARNING

  • Beihang University
  • CNCERT/CC
  • Zhongyuan University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Deepfake detection technologies have been developed rapidly in recent years, due to the potential severe security threats induced by the realistic deep facial forgeries. Among the existing deepfake detection methods, self-supervised methods have drawn significant attentions from researchers, because of their better generalization ability against the deep forgeries produced via unseen deepfake techniques. Unfortunately, existing state-of-the-art self-supervised approaches have not properly considered that different pairs of patches from different regions actually give different contributions. Thus, their learned representations are coarse and the generalization performances are less decent. In this paper, we propose a new self-supervised deepfake detection method, named deepfake detection via separable self-consistency learning (SSCL-DFD), to improve the generalization ability of deepfake detection. Specifically, to effectively extract detection features, we construct a multi-scale Texture Enhanced Feature Extraction Network (TEFEN), by forming a Central-Difference based Convolution Module (CDCM) to enhance the texture information, which contain rich forgery cues. Since different pairs of patches from different regions (i.e. background and facial regions) tend to give various consistencies, we propose a separable self-consistency loss to explicitly constrain the representation learning. Extensive experiments demonstrate that our SSCL-DFD can give superior generalization performances compared to the state-of-the-art methods.

Original languageEnglish
Title of host publication2024 IEEE International Conference on Image Processing, ICIP 2024 - Proceedings
PublisherIEEE Computer Society
Pages3264-3270
Number of pages7
ISBN (Electronic)9798350349399
DOIs
StatePublished - 2024
Event31st IEEE International Conference on Image Processing, ICIP 2024 - Abu Dhabi, United Arab Emirates
Duration: 27 Oct 2024 → 30 Oct 2024

Publication series

NameProceedings - International Conference on Image Processing, ICIP
ISSN (Print)1522-4880

Conference

Conference31st IEEE International Conference on Image Processing, ICIP 2024
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period27/10/24 → 30/10/24

Keywords

  • Deepfake detection
  • Generalization ability
  • Self-consistency learning
  • Self-supervised learning

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