TY - GEN
T1 - Creep characterization of lead free 80Au-20Sn solder
AU - Fei, Su
AU - Haiyan, Pan
PY - 2009
Y1 - 2009
N2 - In this paper, steady-state creep behavior of lead free 80Au-20Sn solder was investigated at three different temperatures (i.e. 25°C, 75°C and 125°C) and a range of stress levels. Hyperbolic-Sine model was employed to characterize the creep properties of the lead free solder, constants in the model were determined through data fitting and were compared with that of other lead free solders.
AB - In this paper, steady-state creep behavior of lead free 80Au-20Sn solder was investigated at three different temperatures (i.e. 25°C, 75°C and 125°C) and a range of stress levels. Hyperbolic-Sine model was employed to characterize the creep properties of the lead free solder, constants in the model were determined through data fitting and were compared with that of other lead free solders.
UR - https://www.scopus.com/pages/publications/70449972483
U2 - 10.1109/ICEPT.2009.5270656
DO - 10.1109/ICEPT.2009.5270656
M3 - 会议稿件
AN - SCOPUS:70449972483
SN - 9781424446599
T3 - 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009
SP - 718
EP - 721
BT - 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009
T2 - 2009 International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2009
Y2 - 10 August 2009 through 13 August 2009
ER -