Counterfeit identification method of plastic encapsulated microcircuits using scanning acoustic microscope

Scanning acoustic microscope (SAM) is usually used to detect whether the chips, substrate and pins of PEMs have delamination, cracks, voids and other defects. In this paper, a method of identifying surface treatment counterfeit components using SAM was proposed. In the proposed method, the suspicious components were scanned respectively using scanning modes of A-scan, X-scan and C-scan to focus on different depths of interface. The final image was obtained to identify the fake features. Finally, based on the actual case, validity and accuracy of the method to identify the counterfeit components were analyzed and verified. SAM operates non-destructively and proved to be an extremely useful tool complementing current state-of-the-art methods for counterfeit identification.