TY - GEN
T1 - Correlation between complex network features and robustness in linux kernel modules
AU - Wang, Lei
AU - Wang, Xinchen
AU - Wu, Dingzeyu
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/11/22
Y1 - 2017/11/22
N2 - After studying the node degree distribution and average path length of the kernel module call graphs of 223 Linux kernels (V1.1.0 to V2.4.35), we have found that the call graphs of the file system, drivers, kernel, and memory management modules are scale-free small-world complex networks that exhibit strong clustering tendency. Using the random error case and attack case methods, we investigated the robustness of the modules by removing the nodes in their call graphs. We further proposed the Critical Removal Ratio to measure the robustness of these modules from the point view of complex networks. Finally, we showed correlations between robustness and the complex network features of kernel modules.
AB - After studying the node degree distribution and average path length of the kernel module call graphs of 223 Linux kernels (V1.1.0 to V2.4.35), we have found that the call graphs of the file system, drivers, kernel, and memory management modules are scale-free small-world complex networks that exhibit strong clustering tendency. Using the random error case and attack case methods, we investigated the robustness of the modules by removing the nodes in their call graphs. We further proposed the Critical Removal Ratio to measure the robustness of these modules from the point view of complex networks. Finally, we showed correlations between robustness and the complex network features of kernel modules.
UR - https://www.scopus.com/pages/publications/85043478186
U2 - 10.1109/SATE.2017.18
DO - 10.1109/SATE.2017.18
M3 - 会议稿件
AN - SCOPUS:85043478186
T3 - Proceedings - 2017 Annual Conference on Software Analysis, Testing and Evolution, SATE 2017
SP - 80
EP - 89
BT - Proceedings - 2017 Annual Conference on Software Analysis, Testing and Evolution, SATE 2017
A2 - Xie, Xiaoyuan
A2 - Dong, Wei
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 International Conference on Software Analysis, Testing and Evolution, SATE 2017
Y2 - 3 November 2017 through 4 November 2017
ER -