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CORN: In-Buffer Computing for Binary Neural Network

  • Beihang University
  • University of California at Santa Barbara

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Binary Neural Networks (BNNs) have obtained great attention since they reduce memory usage and power consumption as well as achieve a satisfying recognition accuracy on Image Classification. In particular to the computation of BNNs, the multiply-accumulate operations of convolution-layer are replaced with the bit-wise operations (XNOR and pop-count). Such bit-wise operations are well suited for the hardware accelerator such as in-memory computing (IMC). However, an additional digital processing unit (DPU) is required for the pop-count operation, which induces considerable data movement between the Process Engines (PEs) and data buffers reducing the efficiency of the IMC. In this paper, we present a BNN computing accelerator, namely CORN, which consists of a Spin-Orbit-Torque Magnetic RAM (SOT-MRAM) based data buffer to perform the majority operation (to replace the pop-count process) with the SOT-MRAM-based IMC to accelerate the computing of BNNs. CORN can naturally implement the XNOR operation in the NVM memory array, and feed results to the computing data buffer for the majority write operation. Such a design removes the pop-counter implemented by the DPU and reduces data movement between the data buffer and the memory array. Based on the evaluation results, CORN achieves 61% and 14% power saving with 1.74× and 2.12× speedup, compared to the FPGA and DPU based IMC architecture, respectively.

Original languageEnglish
Title of host publicationProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages384-389
Number of pages6
ISBN (Electronic)9783981926323
DOIs
StatePublished - 14 May 2019
Event22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 - Florence, Italy
Duration: 25 Mar 201929 Mar 2019

Publication series

NameProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019

Conference

Conference22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
Country/TerritoryItaly
CityFlorence
Period25/03/1929/03/19

Keywords

  • Binary Neural Networks
  • MRAM
  • Preset-XNOR
  • Spin Orbit Torque
  • Write Operation

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