Abstract
A study was made on the consistency identification method of failure mechanism. Three common methods based on the acceleration model parameters unchanged, based on the statistical methods and based on the experimental observation were studied. It was found that the three methods need the accelerated test data for the consistency identification method of failure mechanism, but this could not provide theoretical guidance for the accelerated test. A consistency identification method of failure mechanism based on grey theory was put forward, which can be used for failure mechanism consistency identification by the pre-test data. Combined with the pre-test data of a certain type of photoelectric encoder, the conclusion was drawn that 175°C was the change point of the failure mechanism using this method. It made a contrast with the method based on statistical. Finally, the failure mechanism analysis for the products was used to verify the correctness of the method.
| Original language | English |
|---|---|
| Pages (from-to) | 734-738+744 |
| Journal | Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics |
| Volume | 39 |
| Issue number | 6 |
| State | Published - Jun 2013 |
Keywords
- Consistency identification method
- Failure mechanism
- Grey theory
- Light-emitting diode
- Phototransistor
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