TY - GEN
T1 - Comparative evaluation of expert system testing methods
AU - Kirani, S.
AU - Zualkernan, I. A.
AU - Tsai, W. T.
N1 - Publisher Copyright:
© 1992 IEEE.
PY - 1992
Y1 - 1992
N2 - Effective testing (validation, verification and evaluation) for expert systems is becoming important. In this paper we do a comparative evaluation of blackbox, white-box, consistency and completeness testing methods based on the criteria of effectiveness, robustness and cost. Testing methods are evaluated using "life-cycle mutation testing" on a VLSI manufacturing diagnostic expert system.
AB - Effective testing (validation, verification and evaluation) for expert systems is becoming important. In this paper we do a comparative evaluation of blackbox, white-box, consistency and completeness testing methods based on the criteria of effectiveness, robustness and cost. Testing methods are evaluated using "life-cycle mutation testing" on a VLSI manufacturing diagnostic expert system.
UR - https://www.scopus.com/pages/publications/79960303882
U2 - 10.1109/TAI.1992.246425
DO - 10.1109/TAI.1992.246425
M3 - 会议稿件
AN - SCOPUS:79960303882
T3 - Proceedings - International Conference on Tools with Artificial Intelligence, ICTAI
SP - 334
EP - 341
BT - 4th International Conference on Tools with Artificial Intelligence, ICTAI 1992
PB - IEEE Computer Society
T2 - 4th International Conference on Tools with Artificial Intelligence, ICTAI 1992
Y2 - 10 November 1992 through 13 November 1992
ER -