TY - GEN
T1 - Combined reliability test for software-hardware system
AU - Huang, Linzhi
AU - Ai, Jun
AU - Wang, Jinhui
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/10/7
Y1 - 2014/10/7
N2 - In the traditional reliability test for system, the reliability of software is usually regarded as '1', therefore the software and hardware correlated failures cannot be motivated, which lead to the inaccuracy of the reliability evaluation result. An approach of combined reliability test for software-hardware system is proposed in this paper. The combined reliability test profile for software-hardware system is structured primarily, then the comprehensive environment stress test and software reliability test are conducted integratedly, which depicts the actual serve condition of the software-hardware system. Some software and hardware correlated failures can be found in the process of the combined test, which contribute a lot to the accuracy of the system reliability evaluation.
AB - In the traditional reliability test for system, the reliability of software is usually regarded as '1', therefore the software and hardware correlated failures cannot be motivated, which lead to the inaccuracy of the reliability evaluation result. An approach of combined reliability test for software-hardware system is proposed in this paper. The combined reliability test profile for software-hardware system is structured primarily, then the comprehensive environment stress test and software reliability test are conducted integratedly, which depicts the actual serve condition of the software-hardware system. Some software and hardware correlated failures can be found in the process of the combined test, which contribute a lot to the accuracy of the system reliability evaluation.
KW - Hardware-software systems
KW - Profile
KW - Reliability test
UR - https://www.scopus.com/pages/publications/84910609110
U2 - 10.1109/CYBER.2014.6917543
DO - 10.1109/CYBER.2014.6917543
M3 - 会议稿件
AN - SCOPUS:84910609110
T3 - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
SP - 658
EP - 663
BT - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th Annual IEEE International Conference on Cyber Technology in Automation, Control and Intelligent Systems, IEEE-CYBER 2014
Y2 - 4 June 2014 through 7 June 2014
ER -