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Characterization of surface modified TiO2 photocatalytic thin films

  • Shukai Zheng*
  • , Weichang Hao
  • , Zuan Cheng
  • , Feng Pan
  • , Tianmin Wang
  • , Yanling Zhao
  • , Xiangning Jiang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Anatase phase TiO2 thin films were prepared on microscope glass slides by r.f. magnetron sputtering using Ar and O2 mixed gases. Then tantalum modified TiO2 thin film was obtained to improve its photocatalytic activity. The films were characterized by X-ray diffraction (XRD), atomic force microscope (AFM) and UV-VIS spectrophotometer. The results indicated that using proper quantity of Ta to modify the surface of TiO2 thin film can improve its photocatalytic activity.

Original languageEnglish
Pages (from-to)125-127
Number of pages3
JournalXiyou Jinshu Cailiao Yu Gongcheng/Rare Metal Materials and Engineering
Volume33
Issue number2
StatePublished - Feb 2004

Keywords

  • Photocatalytic activity
  • Surface modification
  • TiO thin film

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