@inproceedings{bef01c233cf64e22a7f662d5ad5e3e8d,
title = "Characterization of millimeter-wave active and passive components embedded in test fixtures",
abstract = "The performance of millimeter-wave active and passive components is sensitive to the discontinuities associated with the test fixtures. In order to accurately characterize the device-under-test (DUT) and obtain the DUT only performance, the fixture effects must be removed from the overall measurement. Such process is generally referred to as de-embedding. In this work, different de-embedding methods are reviewed and two of these namely the thru-reflect-line (TRL) and the thru-line (TL) are employed to de-embed an edge-coupled band-pass filter (BPF) and a low noise amplifier (LNA) both operating at Ka band. The two DUTs along with the TRL kit are realized on a substrate with dielectric constant of 6.2. Measured results obtained from the two methods are compared.",
keywords = "DUT, De-embedding, Millimter-wave, Thru-line, Thru-reflect-line",
author = "Ghulam Mehdi and Hu Anyong and Zheng Cheng and J. Miao and Abdul Mueed",
year = "2013",
doi = "10.1109/FIT.2013.32",
language = "英语",
isbn = "9781479922932",
series = "Proceedings - 11th International Conference on Frontiers of Information Technology, FIT 2013",
pages = "136--139",
booktitle = "Proceedings - 11th International Conference on Frontiers of Information Technology, FIT 2013",
note = "11th International Conference on Frontiers of Information Technology, FIT 2013 ; Conference date: 16-12-2013 Through 18-12-2013",
}