Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method

Zhen Zhou; Yong Li Chen; Li Shuang Feng

doi:10.1007/s10762-016-0290-9

Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method

Zhen Zhou
, Yong Li Chen^*
, Li Shuang Feng

^*Corresponding author for this work

School of Instrumentation and Optoelectronic Engineering

Beihang University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately.

Original language	English
Pages (from-to)	953-964
Number of pages	12
Journal	Journal of Infrared, Millimeter, and Terahertz Waves
Volume	37
Issue number	10
DOIs	https://doi.org/10.1007/s10762-016-0290-9
State	Published - 1 Oct 2016

Keywords

Dynamic measurement method
First-order model
Metamaterials
THz modulator

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10.1007/s10762-016-0290-9

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@article{efd248f1ea7b4fdb8de8a6ebd9767cce,

title = "Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method",

abstract = "The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately.",

keywords = "Dynamic measurement method, First-order model, Metamaterials, THz modulator",

author = "Zhen Zhou and Chen, \{Yong Li\} and Feng, \{Li Shuang\}",

note = "Publisher Copyright: {\textcopyright} 2016, Springer Science+Business Media New York.",

year = "2016",

month = oct,

day = "1",

doi = "10.1007/s10762-016-0290-9",

language = "英语",

volume = "37",

pages = "953--964",

journal = "Journal of Infrared, Millimeter, and Terahertz Waves",

issn = "1866-6892",

publisher = "Springer New York",

number = "10",

}

TY - JOUR

T1 - Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method

AU - Zhou, Zhen

AU - Chen, Yong Li

AU - Feng, Li Shuang

PY - 2016/10/1

Y1 - 2016/10/1

N2 - The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately.

AB - The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately.

KW - Dynamic measurement method

KW - First-order model

KW - Metamaterials

KW - THz modulator

UR - https://www.scopus.com/pages/publications/84983748445

U2 - 10.1007/s10762-016-0290-9

DO - 10.1007/s10762-016-0290-9

M3 - 文章

AN - SCOPUS:84983748445

SN - 1866-6892

VL - 37

SP - 953

EP - 964

JO - Journal of Infrared, Millimeter, and Terahertz Waves

JF - Journal of Infrared, Millimeter, and Terahertz Waves

IS - 10

ER -

Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method

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Keywords

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