Blind image steganalysis based on statistical analysis of empirical matrix

  • Xiaochuan Chen*
  • , Yunhong Wang
  • , Tieniu Tan
  • , Lei Guo
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram (PH) of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image [7] are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance.

Original languageEnglish
Title of host publicationProceedings - 18th International Conference on Pattern Recognition, ICPR 2006
Pages1107-1110
Number of pages4
DOIs
StatePublished - 2006
Event18th International Conference on Pattern Recognition, ICPR 2006 - Hong Kong, China
Duration: 20 Aug 200624 Aug 2006

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume3
ISSN (Print)1051-4651

Conference

Conference18th International Conference on Pattern Recognition, ICPR 2006
Country/TerritoryChina
CityHong Kong
Period20/08/0624/08/06

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