TY - GEN
T1 - Blind image steganalysis based on statistical analysis of empirical matrix
AU - Chen, Xiaochuan
AU - Wang, Yunhong
AU - Tan, Tieniu
AU - Guo, Lei
PY - 2006
Y1 - 2006
N2 - In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram (PH) of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image [7] are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance.
AB - In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram (PH) of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image [7] are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance.
UR - https://www.scopus.com/pages/publications/34147139894
U2 - 10.1109/ICPR.2006.332
DO - 10.1109/ICPR.2006.332
M3 - 会议稿件
AN - SCOPUS:34147139894
SN - 0769525210
SN - 9780769525211
T3 - Proceedings - International Conference on Pattern Recognition
SP - 1107
EP - 1110
BT - Proceedings - 18th International Conference on Pattern Recognition, ICPR 2006
T2 - 18th International Conference on Pattern Recognition, ICPR 2006
Y2 - 20 August 2006 through 24 August 2006
ER -