@inproceedings{11b4fc9f74a04787be20e3f01a297960,
title = "BIST-based method for diagnosing multiple faulty CLBs in FPGAs",
abstract = "This paper presents a new built-in self test (BIST) method to realize the fault detection and the fault diagnosis of configurable logic blocks (CLBs) in FPGAs. The proposed BIST adopts a circular comparison structure to overcome the phenomenon of fault masking in diagnosing multiple faulty CLBs and improve the diagnostic resolution. To test the memory block in every CLB, different TPG structures are proposed to obtain maximum stuck-at fault coverage. For the LUT mode of the memory block, the TPG based on the LFSR is designed to provide Pseudo-exhaustive testing patterns, and for the distributed RAM mode of the memory block, the TPG based on FSM is designed to provide March C- testing patterns. Besides, the comparator-based output response analyzer (ORA) and the cascaded ORA scan chain are used to locate the faulty CLB and propagate the comparison output in every row. Finally, fault-injection experiment results verify its ability to detect and diagnose multiple faulty CLBs in faulty FPGAs.",
keywords = "BIST, Fault diagnosis, March C-, Pseudo-exhaustive testing, Scan chain",
author = "Wang, \{Guo Hua\} and Sun, \{Jing Lin\}",
note = "Publisher Copyright: {\textcopyright} (2014) Trans Tech Publications, Switzerland.; 2nd Asian Pacific Conference on Mechatronics and Control Engineering, APCMCE 2014 ; Conference date: 08-08-2014 Through 09-08-2014",
year = "2014",
doi = "10.4028/www.scientific.net/AMM.643.243",
language = "英语",
series = "Applied Mechanics and Materials",
publisher = "Trans Tech Publications Ltd",
pages = "243--248",
editor = "Wen Jin",
booktitle = "Engineering Providing of Industrial Development",
address = "瑞士",
}