Assembly process research of to package power transistor in aerospace electronic products

  • Ningning Wang*
  • , Qiong Wu
  • , Zongpeng He
  • , Zhenming Zhang
  • , Wei Zhang
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, two processes which are adopted to produce TO packaged power devices are concerned about. The relationship between process factors and equivalent stress and deformation in the joint are studied. Finite element simulation method is adopted to analyze the equivalent stress, strain and deformation in the two processes. Results indicate that both the two processes produce large equivalent stresses, which are over 180MPa. The peak stress locates at the root of contact area of leg and pipe. On the whole, welding stress of process A is larger due to the relatively larger mechanical restraint. To improve the long term reliability for the TO package products, here we put forward a new process, by which smaller equivalent stress is produced.

Original languageEnglish
Title of host publication2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
EditorsKeyun Bi, Zhong Tian, Ziqiang Xu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages343-346
Number of pages4
ISBN (Electronic)9781479947072
DOIs
StatePublished - 13 Oct 2014
Externally publishedYes
Event2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014 - Chengdu, China
Duration: 12 Aug 201415 Aug 2014

Publication series

NameProceedings of the Electronic Packaging Technology Conference, EPTC

Conference

Conference2014 15th International Conference on Electronic Packaging Technology, ICEPT 2014
Country/TerritoryChina
CityChengdu
Period12/08/1415/08/14

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