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ARO: Autoregressive Operator Learning for Transferable and Multi-fidelity 3D-IC Thermal Analysis with Active Learning

  • Mingyue Wang
  • , Yuanqing Cheng
  • , Weiheng Zeng
  • , Zhenjie Lu
  • , Vasilis F. Pavlidis
  • , Wei W. Xing*
  • *Corresponding author for this work
  • Beihang University
  • Shenzhen University
  • Aristotle University of Thessaloniki
  • University of Sheffield

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

As 3D integrated circuits (ICs) have emerged as a promising direction in the semiconductor industry, thermal issues in 3D-ICs have become increasingly prominent. In this work, we develop a novel machine learning (ML) thermal analysis framework, namely Autoregressive Operator (ARO), to address the pressing need for rapid yet highly accurate thermal predictions during the chip design process. Unlike traditional ML-based methods that can only deal with scenarios of well-defined input-output domains, ARO learns the thermal diffusion operator such that it can generalize to any unseen circuits and map the power traces to the steady-state/transient thermal spatial-temporal distributions. To further reduce the computational demand of data preparation, we equip ARO with multi-fidelity fusion to exploit the advantage of computationally cheap low-fidelity simulations and expensive high-fidelity simulations and active learning to guide the preparation of training data. Our results show that, for the unseen testing cases, a well-trained ARO can produce accurate results with about 1000× speedup compared to MTA. Moreover, equipped with active learning, ARO achieves at least 25% data reduction compared to pseudo-random strategies.

Original languageEnglish
Title of host publicationProceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798400710773
DOIs
StatePublished - 9 Apr 2025
Event43rd International Conference on Computer-Aided Design, ICCAD 2024 - New York, United States
Duration: 27 Oct 202431 Oct 2024

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference43rd International Conference on Computer-Aided Design, ICCAD 2024
Country/TerritoryUnited States
CityNew York
Period27/10/2431/10/24

Keywords

  • 3D-IC
  • Fourier Neural Operator
  • Multi-fidelity
  • Thermal Analysis

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