TY - GEN
T1 - Application of Embedded Capacitive Pressure Sensors in Pressure Drop Measurement of Microchannels
AU - Cao, Xiaoda
AU - Xu, Tiantong
AU - Tao, Zhi
AU - Li, Haiwang
AU - Zhai, Yanxin
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - The measurement of pressure drops within microchannels is pivotal for exploring microfluidic flow dynamics and advancing microfluidic device technology. Traditionally, assessing liquid pressure drops in silicon microchannels has necessitated alterations to the original design of the microchannels to accommodate the integration of small pressure sensors. This adaptation, however, introduces a limitation: the small size of the sensor compromises its sensitivity, thereby impairing the reliability of pressure drop measurements. This study explored an approach to the application of capacitive pressure sensors, designed to be seamlessly embedded into microchannels, to accurately measure pressure drops in silicon microchannels. By carefully regulating the outlet pressure, the overall absolute pressure in the microchannel was increased without affecting the pressure drop values. This approach enhanced the capacitive pressure sensor's sensitivity across a broader operational range. The findings from pressure drop tests conducted on a straight microchannel, possessing a hydraulic diameter of 524 μm and examined across a Reynolds number range of 383.8 to 1644.9, align with established macroscopic theories.
AB - The measurement of pressure drops within microchannels is pivotal for exploring microfluidic flow dynamics and advancing microfluidic device technology. Traditionally, assessing liquid pressure drops in silicon microchannels has necessitated alterations to the original design of the microchannels to accommodate the integration of small pressure sensors. This adaptation, however, introduces a limitation: the small size of the sensor compromises its sensitivity, thereby impairing the reliability of pressure drop measurements. This study explored an approach to the application of capacitive pressure sensors, designed to be seamlessly embedded into microchannels, to accurately measure pressure drops in silicon microchannels. By carefully regulating the outlet pressure, the overall absolute pressure in the microchannel was increased without affecting the pressure drop values. This approach enhanced the capacitive pressure sensor's sensitivity across a broader operational range. The findings from pressure drop tests conducted on a straight microchannel, possessing a hydraulic diameter of 524 μm and examined across a Reynolds number range of 383.8 to 1644.9, align with established macroscopic theories.
KW - capacitive pressure sensor
KW - embedded
KW - microchannel
KW - pressure drop
UR - https://www.scopus.com/pages/publications/85203844852
U2 - 10.1109/NEMS60219.2024.10639913
DO - 10.1109/NEMS60219.2024.10639913
M3 - 会议稿件
AN - SCOPUS:85203844852
T3 - 2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024
BT - 2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 19th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2024
Y2 - 2 May 2024 through 5 May 2024
ER -